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We are checking SIM, Port & MIC in sub-pcba testing. To control the MIC defect bypass from SMT we implemented sequence of testing. Model- Blaze Curve sub
There was no sequence at testing
Now we following sequence below to control the MIC defect bypass 1.Port 2.MIC 3.SIM
26-02-2024
28-02-2024
Quality
HOD okby : Rohit dwivedi
KPO: okby : utkersh mishra
CI: okby :