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Kaizen Corner

Sr. No Kaizen No Kaizen Theme Initiator Team Before
Situation
After
Situation
Month
1 LCIK - 43898
Standardization of Aging Time Tracking in FT Process
Ravi Prakash Yadav , 51010012
Anil Kumar chaursiya , 51010623
Vivek Gupta , 51010662
* Aging time was calculated between, " FT Input and FT1 to FT2 stages" * There were multiple scan points, which created confusion In some cases: * Device scanned at FT1 or FT Input incorrectly * Wrong tool mapping occurred * Because of this, *bypass cases were not detected at FT2* * Devices sometimes stayed at FT stage for "1–2 hours before actual aging" but: * Aging timer had already started * Result: "Incorrect aging time calculation and process inconsistency" * Aging time now starts "only when the device is scanned at SFG stage" * Devices are then moved to aging after SFG scan * A "single standardized flow" is implemented: SFG → FT2 * Removed dependency on multiple FT scan points * Ensured "correct tool mapping for all models" * Eliminated early time start before actual aging 04/2026
2 LCIK - 43159
Standard Procedure of Hold SFG Setup.
Vipin kumar singh , 51008102
We have found hold SFG clearance stage LUX Level is too low(550 LUX) comparison to Running stage due to this Visual failure bounce is so ho high. By equally the LUX level(800 LUX) then controlled of high rejection. 09/2025
3 LCIK - 41604
Standard of used PCBA run on line.
Vipin kumar singh , 51008102
So many Handsets are Come on line for IMEI Miss Match at used PCBA because we have not known these PCBA where is hold or rejected at which condition by production. we know that if 1st IMEI write then not taken 2nd time IMEI write on line. If We have used PCBA hold at Production end run on line first we have Done proper ELS after that write PCBA SN then run on line. so control maximum rejection of repair. 10/2024
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